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April 10, 2008 -- NT-MDT's new Solver NEXT is a multifunctional, general-purpose scanning probe microscope (SPM) designed for ease of use and ergonomic operation.
Key features include a pair of measuring heads for atomic-force and scanning-tunneling microscopy (AFM and STM). Solver NEXT allows for manual insertion of additional measuring heads for work using nanoindentation and for experiments in liquid environments. Its capacitive closed-loop sensors compensate for inherent piezoelectric imperfections such as scan nonlinearity, creep, and hysteresis; and samples can be heated to 150 degrees ะก.
A video monitoring subsystem enables high resolution, motorized focusing and continuous zooming. Selection of the scan area is motorized too, and sample positioning is linked to the motion of the video monitoring system so the system automatically aligns the sample's focal area to the SPM measurement area.
Solver NEXT comes with what NT-MDT calls an advanced controller -- and library of Macintosh compatible scripts.
In fact, NT-MDT says it is the first company to introduce scanning probe microscopy (SPM) to Mac users. The company's NanoEducator SPM, now supporting the Mac OS, promises a user-friendly interface, "single-step method settings," and easy sample replacement. The instrument features improved optical and mechanical parts. Users can choose focal regions using a video camera, and a changeable backlight angle allows flexibility in emphasizing image details. Focus control of the video camera prevents probe damage.
NT-MDT's latest releases complement the company's series of NTEGRA Scanning Probe NanoLaboratory instruments.
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