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Nov. 16, 2006 -- Rigaku Americas of The Woodlands, Texas, announced that it will introduce a new advanced automated X-ray Diffraction system specifically designed and equipped for nanomaterials research: the Rigaku SmartLab NANO-Extreme.
The company intends to introduce the system at the Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy to be held February 26 to March 2, 2007 in Chicago.
The system combines a horizontal sample mount with patented Cross Beam Optic (CBO) technology, and is equipped with proprietary software. It is intended to offer nanomaterials researchers the full range of X-ray diffraction measurements in a fully-automated instrument.
Rigaku says the SmartLab NANO-Extreme is designed for a variety of applications, including powder diffraction for bulk nanomaterial identification, glancing incidence diffraction for the analysis of deposited structures, Small Angle X-ray Scattering for determination of general morphology and particle size distributions in both liquids and solids, and in-plane diffraction for surface orientation and analysis of ultra-thin layers, among other applications.
Rigaku's SmartLab NANO-Extreme is specifically designed and equipped for nanomaterials research. |
Rigaku will also debut its new MiniFlex II benchtop X-ray diffraction system and the Rigaku NANOHUNTER benchtop Total Reflection X-ray Fluorescence spectrometer.
The MiniFlex II's variable incident beam slit and diffracted beam monochromator make it suitable for a wide range of applications, including phase ID, quantitative analysis, crystallinity measurement, and structural characterization.
The new NANOHUNTER features fully automatic control of all axes, allowing surface analysis and also multiple layer coating and substrate analysis.
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